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010 a| 2018002053;

020 a| 9780815378822 (hardback : acid-free paper);

020 z| 9781351227780 (ebook);

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050 00 a| TK7874.75b| .C464 2018;

082 00 a| 621.39/502872| 23;

100 1 a| Chattopadhyay, Santanu.?| UNAUTHORIZED;

245 10 a| Thermal-aware testing of digital VLSI circuits and systemsh| [electronic resource] /c| Santanu Chattopadhyay.;

250 a| First edition.;

260 a| Boca Raton, FL :b| Taylor & Francis Group, CRC Press,c| 2018.;

263 a| 1807;

300 a| pages cm;

504 a| Includes bibliographical references and index.;

506 a| Available only to authorized users.;

520 a| The book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. The book will be suitable for the researchers working on power- and thermal-aware design and test of digital VLSI chips--c| Provided by publisher.;

538 a| Mode of access: World Wide Web;

650 0 a| Integrated circuitsx| Very large scale integrationx| Testing.=| ^A991919;

650 0 a| Digital integrated circuitsx| Testing.=| ^A65093;

650 0 a| Integrated circuitsx| Very large scale integrationx| Thermal properties.=| ^A144311;

650 0 a| Temperature measurements.=| ^A264315;

655 0 a| Electronic books.=| ^A491897;

856 40 z| Full text available from Taylor & Francis eBooksu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fwww.taylorfrancis.com%2Fbooks%2F9781351227780;

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Thermal-aware testing of digital VLSI circuits and systems / Santanu Chattopadhyay.

Author/creator	Chattopadhyay, Santanu
Format	Electronic
Edition	First edition.
Publication Info	Boca Raton, FL : Taylor & Francis Group, CRC Press, 2018.
Description	pages cm
Supplemental Content	Full text available from Taylor & Francis eBooks
Subjects	Integrated circuits--Very large scale integration. --Testing. Digital integrated circuits--Testing. Integrated circuits--Very large scale integration. --Thermal properties. Temperature measurements.

Abstract	The book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. The book will be suitable for the researchers working on power- and thermal-aware design and test of digital VLSI chips-- Provided by publisher.
Bibliography note	Includes bibliographical references and index.
Access restriction	Available only to authorized users.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	2018002053
ISBN	9780815378822 (hardback : acid-free paper)

Thermal-aware testing of digital VLSI circuits and systems / Santanu Chattopadhyay.

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