Simplified data reduction methods for the ECT test for mode III interlaminar fracture toughness / Jian Li, T. Kevin O'Brien.
| Author/creator | Li, Jian |
| Other author | O'Brien, T. Kevin. |
| Other author | Langley Research Center. |
| Format | Book |
| Publication Info | Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va.] : [National Technical Information Service, distributor], [1995] |
| Description | 1 volume. |
| Series | NASA technical memorandum ; 110176 NASA technical memorandum 110176. ^A467613 |
| General note | Distributed to depository libraries in microfiche. |
| General note | Shipping list no.: 96-0033-M. |
| Reproduction note | Joyner- Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1995] 1 microfiche. |
| GPO item number | 0830-D (MF) |
| Govt. docs number | NAS 1.15:110176 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Microforms B300 | NAS 1.15:110176 | ✔ Available |