Test structure implementation document : DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs) / C.E. Schuster ; sponsored by Defense Advanced Research Projects Agency and U.S. Air Force Wright Laboratory.
| Author/creator | Schuster, C. E. |
| Other author | United States. Defense Advanced Research Projects Agency. |
| Other author | Wright Laboratory (Wright-Patterson Air Force Base, Ohio) |
| Other author | National Institute of Standards and Technology (U.S.) |
| Format | Microform |
| Publication Info | Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington : For sale by the Supt. of Docs., U.S. G.P.O., 1995. |
| Description | iv, 88 pages : illustrations ; 28 cm. |
| Subjects |
| Series | Semiconductor measurement technology NIST special publication ; 400-97 NIST special publication 400-97. ^A390056 Semiconductor measurement technology. ^A428054 |
| General note | Distributed to depository libraries in microfiche. |
| General note | Shipping list no.: 96-0273-M. |
| General note | "September 1995." |
| Bibliography note | Includes bibliographical references (p. 14). |
| Reproduction note | Joyner- Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1996] 2 microfiches : negative. |
| GPO item number | 0247 (MF) |
| Govt. docs number | C 13.10:400-97 |