Design and testing guides for the CMOS and lateral bipolar-on-SOI test library / Janet C. Marshall and Mona E. Zaghloul.
| Author/creator | Marshall, J. C. |
| Other author | Zaghloul, M. E. (Mona Elwakkad) |
| Other author | National Institute of Standards and Technology (U.S.) |
| Format | Microform |
| Publication Info | Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington : For sale by the Supt. of Docs., U.S. G.P.O., 1994. |
| Description | vi, 132 pages : illustrations. |
| Subjects |
| Series | NIST special publication ; 400-93 Semiconductor measurement technology Semiconductor measurement technology. ^A428054 NIST special publication 400-93. ^A390056 |
| General note | Distributed to depository libraries in microfiche. |
| General note | Shipping list no.: 94-0625-M. |
| General note | "March 1994." |
| Bibliography note | Includes bibliographical references (p. 17-18). |
| Reproduction note | Joyner- Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1994] 2 microfiches : negative. |
| GPO item number | 0247 (MF) |
| Govt. docs number | C 13.10:400-93 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Microforms B300 | C 13.10:400-93 | ✔ Available |