National Semiconductor Metrology Program : [catalog] / EEEL, Semiconductor Electronics Division, Office of Microelectronics Programs [i.e. National Semiconductor Metrology Program].
| Author/creator | National Semiconductor Metrology Program (U.S.) |
| Other author | Electronics and Electrical Engineering Laboratory (National Institute of Standards and Technology) |
| Other author | National Institute of Standards and Technology (U.S.) |
| Other author | National Institute of Standards and Technology (U.S.). Office of Microelectronics Programs. |
| Format | Book |
| Publication Info | Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1995- |
| Description | v. ; 28 cm. |
| Supplemental Content | click on "Publications" to view publications for the most recent year |
| Subjects |
| Frequency | Annual |
| Series | NIST list of publications ; LP 103 NIST list of publications ; 103. ^A440922 |
| General note | Address: National Technical Information Service, U.S. Dept. of Commerce, Attn: NTIS Order Clerk, Springfield, VA 22161. |
| General note | Title from cover. |
| General note | GPO Cataloging Record Distribution Program (CRDP). |
| Special numbering | Each issue cumulates from 1990 (i.e., v. for Mar. 1995 covers period 1990-1994). |
| Other forms | Titles for the latest year (not cumulative) also available via Internet from the EEEL web site. Address as of 9/8/00: http://www.eeel.nist.gov/810.01/; current access is available via PURL. |
| Preceding title | National Institute of Standards and Technology. Semiconductor measurement technology |
| Other title | National Semiconductor Metrology Program and Semiconductor Electronics Division publications. |
| LCCN | sn 95027357 |
| GPO item number | 0240-A-01 |
| GPO item number | 0240-A-01 (online) |
| Govt. docs number | C 13.37:103/ |