Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites / David G. Seiler [and others].
| Other author | Seiler, David G. |
| Other author | National Institute of Standards and Technology (U.S.) |
| Format | Microform |
| Publication Info | Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 1994. |
| Description | 1 volume (various pagings) : illustrations. |
| Subjects |
| Series | NIST special publication ; 400-94 Semiconductor measurement technology Semiconductor measurement technology. ^A428054 NIST special publication 400-94. ^A390056 |
| General note | Distributed to depository libraries in microfiche. |
| General note | Shipping list no.: 94-0562-M. |
| General note | "April 1994." |
| Bibliography note | Includes bibliographical references. |
| Reproduction note | Joyner- Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1994] 3 microfiches : negative. |
| GPO item number | 0247 (MF) |
| Govt. docs number | C 13.10:400-94 |