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001 ocm01960350;

003 OCoLC;

005 20141212142235.0;

008 751120s1976 dcua b f100 0 eng ;

010 a| 75619388;

035 a| (Sirsi) o01960350;

035 a| (OCoLC)1960350;

049 a| ERE#;

050 00 a| QC100b| .U57 no. 400-15a| TK7874;

082 00 a| 602.1 sa| 621.381/73;

086 0 a| C 13.10:400-15;

100 1 a| Schafft, Harry A.=| ^A450733;

245 10 a| ARPA/NBS workshop III :b| test patterns for integrated circuits /c| Harry A. Schafft, editor.;

260 a| Washington :b| U.S. Dept. of Commerce, National Bureau of Standards :b| For sale by the Supt. of Docs., U.S. Govt. Print. Off,c| 1976.;

300 a| v, 46 pages :b| illustrations ;c| 26 cm.;

336 a| text2| rdacontent;

337 a| unmediated2| rdamedia;

338 a| volume2| rdacarrier;

490 1 a| Semiconductor measurement technology;

490 1 a| NBS special publication ;v| 400-15;

500 a| Consists of synopses of talks and discussions presented at the workshop held Sept. 6, 1974 in Scottsdale, Ariz.;

504 a| Includes bibliographical references.;

650 0 a| Integrated circuitsx| Testingv| Congresses.=| ^A598122;

650 0 a| Electronic industriesx| Quality controlv| Congresses.=| ^A128924;

650 0 a| Automatic data collection systemsv| Congresses.=| ^A1235744;

830 0 a| Semiconductor measurement technology.=| ^A428054;

830 0 a| NBS special publicationv| 400-15.=| ^A2701;

994 a| C0b| ERE;

596 a| 1;

998 a| 736990;

999 a| C 13.10:400-15w| SUDOCc| 1i| 30372013333759d| 6/8/2005l| JDOSm| JOYNERr| Ys| Yt| JDOSBKu| 6/3/2000x| BOOKz| JFEDDOCSo| .STAFF. 0;

ARPA/NBS workshop III : test patterns for integrated circuits / Harry A. Schafft, editor.

Author/creator	Schafft, Harry A.
Format	Book
Publication Info	Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off, 1976.
Description	v, 46 pages : illustrations ; 26 cm.
Subjects	Integrated circuits--Testing. --Congresses. Electronic industries--Quality control. --Congresses. Automatic data collection systems--Congresses.

Series	Semiconductor measurement technology NBS special publication ; 400-15 Semiconductor measurement technology. ^A428054 NBS special publication 400-15. ^A2701
General note	Consists of synopses of talks and discussions presented at the workshop held Sept. 6, 1974 in Scottsdale, Ariz.
Bibliography note	Includes bibliographical references.
LCCN	75619388
Govt. docs number	C 13.10:400-15

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