Defects in PN junctions and MOS capacitors observed using thermally stimulated current and capacitance measurements, videotape script / Martin G. Buehler.
| Author/creator | Buehler, Martin G. |
| Format | Book |
| Publication Info | Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off, 1976. |
| Description | iii, 14 pages : illustrations ; 26 cm. |
| Subjects |
| Series | Semiconductor measurement technology NBS special publication ; 400-26 Semiconductor measurement technology. ^A428054 NBS special publication 400-26. ^A2701 |
| Bibliography note | Includes bibliographical references (p. 14). |
| LCCN | 76608059 |
| Govt. docs number | C 13.10:400-26 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Fed Docs Stacks | C 13.10:400-26 | ✔ Available | Place Hold |