Software quality lessons from medical device failure data / Dolores R. Wallace, D. Richard Kuhn.
| Author/creator | Wallace, Dolores R. |
| Other author | Kuhn, D. Richard. |
| Other author | National Institute of Standards and Technology (U.S.) |
| Format | Microform |
| Publication Info | Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [1999] |
| Description | vi, 22 pages : illustrations. |
| Subjects |
| Series | NISTIR ; 6407 NISTIR ; 6407. ^A682451 |
| General note | Shipping list no.: 2000-0148-M. |
| General note | "November 1999." |
| Bibliography note | Includes bibliographical references (p. 21-22). |
| Reproduction note | Joyner- Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O, [1999] 1 microfiche : negative. |
| GPO item number | 0247-D (MF) |
| Govt. docs number | C 13.58:6407 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Microforms B300 | C 13.58:6407 | ✔ Available |