The influence of modulated signal risetime in flight electronics radiated immunity testing with a mode-stirred chamber / Jay J. Ely, Truong X. Nguyen, Stephen A. Searce.

Author/creator Ely, Jay J.
Other author Nguyen, Truong X.
Other author Scearce, Stephen A.
Other author Langley Research Center.
Format Microform
Publication InfoHampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; Hanover, MD : Available from NASA Center for AeroSpace Information ; Springfield, VA : National Technical Information Service [distributor], [2000]
Description1 volume.

SeriesNASA/TM ; 2000-209844
NASA technical memorandum 209844. ^A467613
General noteShipping list no.: 2000-0596-M.
General noteCRDP Program record.
Reproduction noteMicrofiche. [Washington, D.C. : National Aeronautics and Space Administration, 2000]. 1 microfiche.
Issued in other formPrint version: Ely, Jay J. Influence of modulated signal risetime in flight electronics radiated immunity testing with a mode-stirred chamber
Issued in other formOnline version: Ely, Jay J. Influence of modulated signal risetime in flight electronics radiated immunity testing with a mode-stirred chamber
GPO item number0830-D (MF)
Govt. docs number NAS 1.15:209844
Stock number20000025323 NASA