A review of U.S. participation in the International Organization for Standardization (ISO) and the International Electrotechnical Commission (IEC) / Christine R. DeVaux.
| Author/creator | DeVaux, Christine R. |
| Other author | National Institute of Standards and Technology (U.S.) |
| Format | Microform |
| Publication Info | Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; [Springfield, Va.] : [National Technical Information Service, distributor], [2000] |
| Description | vii, 70 pages : illustrations ; 28 cm. |
| Subjects |
| Series | NISTIR ; 6492 NISTIR ; 6492. ^A682451 |
| General note | "February 2000." |
| General note | Shipping list no.: 2000-0762-M. |
| Bibliography note | Includes bibliographical references (p. 69-70). |
| Reproduction note | Joyner- Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2000 1 microfiche : negative. |
| GPO item number | 0247-D (MF) |
| Govt. docs number | C 13.58:6492 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Microforms B300 | C 13.58:6492 | ✔ Available |