Optical radiation measurement with selected detectors and matched electronic circuits between 200 nm and 20 [mu]m / George P. Eppeldauer, editor.
| Other author | Eppeldauer, George P. |
| Other author | National Institute of Standards and Technology (U.S.) |
| Format | Microform |
| Publication Info | Gaithersburg, Md. : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, D.C. : For sale by the Supt. of Docs., U.S. G.P.O., [2001] |
| Description | x, 115 pages : illustrations ; 28 cm. |
| Subjects |
| Series | NIST technical note ; 1438 NIST technical note 1438. ^A420535 |
| General note | "April 2001." |
| General note | Shipping list no.: 2001-0361-M. |
| Bibliography note | Includes bibliographical references. |
| Reproduction note | Joyner- Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2001 2 microfiches : negative. |
| GPO item number | 0249-A (MF) |
| Govt. docs number | C 13.46:1438 |