High resolution focused ion beams : FIB and its applications : the physics of liquid metal ion sources and ion optics and their application to focused ion beam technology / Jon Orloff, Mark Utlaut, and Lynwood Swanson.

Author/creator Orloff, Jon
Other author Swanson, Lynwood, 1934-
Other author Utlaut, Mark William, 1949-
Format Book
Publication InfoNew York : Kluwer Academic/Plenum Publishers, ©2003.
Descriptionx, 303 pages : illustrations ; 26 cm
Subjects

Bibliography noteIncludes bibliographical references and index.
LCCN 2002028661
ISBN030647350X

Availability

Library Location Call Number Status Item Actions
Joyner General Stacks QC702.7.B65 O75 2003 ✔ Available Place Hold