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001 ocm48450984;

003 OCoLC;

005 20141212171725.0;

008 010823s2003 nyua b 001 0 eng ;

010 a| 2001053158;

015 a| GBA2-U7620;

019 a| 51482090;

020 a| 1560329416 (alk. paper);

035 a| (Sirsi) o48450984;

035 a| (OCoLC)48450984;

042 a| pcc;

049 a| EREE;

050 00 a| QC611.6.O6b| M52 2003;

082 00 a| 537.6/2262| 21;

245 00 a| Microprobe characterization of optoelectronic materials /c| edited by Juan Jiménez.;

300 a| xiv, 715 pages :b| illustrations ;c| 24 cm.;

336 a| text2| rdacontent;

337 a| unmediated2| rdamedia;

338 a| volume2| rdacarrier;

490 1 a| Optoelectronic properties of semiconductors and superlattices ;v| v. 17;

504 a| Includes bibliographical references and index.;

650 0 a| Semiconductorsx| Optical properties.=| ^A102458;

650 0 a| Microprobe analysis.=| ^A960;

700 1 a| Jiménez, J.q| (Juan)=| ^A559414;

830 0 a| Optoelectronic properties of semiconductors and superlattices ;v| v. 17.=| ^A559413;

994 a| X0b| ERE;

596 a| 1;

998 a| 918886;

999 a| QC611.6.O6 M52 2003w| LCc| 1i| 30372012082761d| 11/13/2003l| JGESm| JOYNERp| $250.00r| Ys| Yt| JGESBKu| 9/4/2003x| BOOKz| JSTACKSo| .STAFF. 0;

Microprobe characterization of optoelectronic materials / edited by Juan Jiménez.

Other author	Jiménez, J. (Juan)
Format	Book
Publication Info	New York : Taylor & Francis, ©2003.
Description	xiv, 715 pages : illustrations ; 24 cm.
Subjects	Semiconductors--Optical properties. Microprobe analysis.

Series	Optoelectronic properties of semiconductors and superlattices ; v. 17 Optoelectronic properties of semiconductors and superlattices ; v. 17. ^A559413
Bibliography note	Includes bibliographical references and index.
LCCN	2001053158
ISBN	1560329416 (alk. paper)

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