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001 ocm54108468;

003 OCoLC;

005 20141212173022.0;

007 he bmb024bbca;

008 040129s2003 mdua bb f000 0 eng d;

035 a| (Sirsi) o54108468;

035 a| (OCoLC)54108468;

049 a| ERE#;

074 a| 0247-D (MF);

074 a| 0247-D (online);

086 0 a| C 13.58:7010;

245 00 a| Semiconductor microelectronics and nanoelectronics programs /c| edited by Stephen Knight, Joaquin V. Martinez de Pinillos, and Michele Buckley.;

260 a| [Gaithersburg, MD] :b| U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,c| [2003];

300 a| vii, 168 pages :b| illustrations ;c| 28 cm.;

336 a| text2| rdacontent;

337 a| microform2| rdamedia;

338 a| microfiche2| rdacarrier;

490 1 a| NISTIR ;v| 7010;

500 a| "July 2003.";

500 a| Shipping list no.: 2004-0094-M.;

504 a| Includes bibliographical references.;

530 a| Also available via Internet from the NIST web site. Address as of 1/22/04: http://www.eeel.nist.gov/omp/Portfolio%202003/F%5Fomp.pdf; current access is available via PURL.;

610 20 a| National Institute of Standards and Technology (U.S.)=| ^A259859;

650 0 a| Semiconductorsx| Measurement.=| ^A16124;

650 0 a| Nanotechnologyx| Research.=| ^A1244409;

650 0 a| Molecular electronicsx| Research.=| ^A357090;

650 0 a| Microelectronicsx| Research.=| ^A574248;

700 1 a| Knight, Stephen.=| ^A126799;

700 1 a| Pinillos, Joaquin V. Martinez de.=| ^A574249;

700 1 a| Buckley, Michele.?| UNAUTHORIZED;

710 2 a| National Institute of Standards and Technology (U.S.)=| ^A259859;

830 0 a| NISTIR ;v| 7010.=| ^A682451;

856 41 u| https://purl.fdlp.gov/GPO/LPS42647;

998 a| 929565;

998 a| u929565;

596 a| 1;

999 a| C 13.58:7010w| SUDOCc| 1i| 40372000192000d| 1/20/2004l| JDOMIm| JOYNERr| Ys| Yt| JDOFMIu| 1/5/2004x| MICROFORMz| JFEDDOCSo| .STAFF. 0;

Semiconductor microelectronics and nanoelectronics programs / edited by Stephen Knight, Joaquin V. Martinez de Pinillos, and Michele Buckley.

Format	Microform
Publication Info	[Gaithersburg, MD] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2003]
Description	vii, 168 pages : illustrations ; 28 cm.
Supplemental Content	https://purl.fdlp.gov/GPO/LPS42647
Subjects	National Institute of Standards and Technology (U.S.) Semiconductors--Measurement. Nanotechnology--Research. Molecular electronics--Research. Microelectronics--Research.

Other author/creator	Knight, Stephen.
Other author/creator	Pinillos, Joaquin V. Martinez de.
Other author/creator	Buckley, Michele.
Other author/creator	National Institute of Standards and Technology (U.S.)
Series	NISTIR ; 7010 NISTIR ; 7010. ^A682451
General note	"July 2003."
General note	Shipping list no.: 2004-0094-M.
Bibliography note	Includes bibliographical references.
Other forms	Also available via Internet from the NIST web site. Address as of 1/22/04: http://www.eeel.nist.gov/omp/Portfolio%202003/F%5Fomp.pdf; current access is available via PURL.
Reproduction note	Joyner- Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2003 2 microfiches : negative.
GPO item number	0247-D (MF)
GPO item number	0247-D (online)
Govt. docs number	C 13.58:7010

Semiconductor microelectronics and nanoelectronics programs / edited by Stephen Knight, Joaquin V. Martinez de Pinillos, and Michele Buckley.

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