Analysis of dimensional metrology standards / John Evans [and others].
| Other author | Evans, John M. (John Martin), 1942- |
| Other author | Manufacturing Engineering Laboratory (U.S.) |
| Other author | National Institute of Standards and Technology (U.S.) |
| Format | Microform |
| Publication Info | Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, Manufacturing Engineering Laboratory, National Institute of Standards and Technology, [2001] |
| Description | vi, 71 pages : illustrations ; 28 cm. |
| Subjects |
| Series | NISTIR ; 6847 NISTIR ; 6847. ^A682451 |
| Abstract | "This paper is an analysis of documentary standards related to dimensional metrology information, with recommendations regarding standards development"--P. 1. |
| General note | "December 19, 2001." |
| General note | Shipping list no.: 2002-0326-M. |
| Bibliography note | Includes bibliographical references (p. 71). |
| Reproduction note | Joyner- Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2002. 1 microfiche : negative. |
| GPO item number | 0247-D (MF) |
| Govt. docs number | C 13.58:6847 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Microforms B300 | C 13.58:6847 | ✔ Available |