Quantifying residual stresses by means of thermoelastic stress analysis / Andrew L. Gyekenyesi, George Y. Baaklini.
| Author/creator | Gyekenyesi, Andrew L. |
| Other author | Baaklini, George Y. |
| Other author | NASA Glenn Research Center. |
| Format | Microform |
| Publication Info | [Cleveland, Ohio] : National Aeronautics and Space Administration, Glenn Research Center : Available from NASA Center for Aerospace Information, [2001] |
| Description | 1 volume. |
| Series | NASA technical memorandum ; NASA/TM-2001-210697 NASA technical memorandum ; 210697. ^A467613 |
| General note | Shipping list no.: 2002-0157-M. |
| General note | CRDP Program record. |
| Reproduction note | Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 2001?]. 1 microfiche. |
| Issued in other form | Print version: Government, U. S. Quantifying residual stresses by means of thermoelastic stress analysis 123419452X |
| Issued in other form | Online version: Gyekenyesi, Andrew L. Quantifying residual stresses by means of thermoelastic stress analysis |
| GPO item number | 0830-D (MF) |
| Govt. docs number | NAS 1.15:210697 |
| Stock number | 20010047387 NASA |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Microforms B300 | NAS 1.15:210697 | ✔ Available |