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001 ocm08014781;

003 OCoLC;

005 20141212181945.0;

008 811222s1981 dcua f000 0 eng d;

035 a| (Sirsi) o08014781;

035 a| (OCoLC)8014781;

049 a| ERE#;

074 a| 244;

086 0 a| C 13.2:St 2/5;

245 00 a| Electron probe microanalysis and scanning electron microscopy.;

260 a| [Washington, D.C.] :b| U.S. Dept. of Commerce, National Bureau of Standards,c| [1981?];

300 a| 1 folded sheet (6 pages) :b| illustrations ;c| 28 cm.;

336 a| text2| rdacontent;

337 a| unmediated2| rdamedia;

338 a| sheet2| rdacarrier;

490 1 a| Standard reference materials;

500 a| "Office of Standard Reference Materials.";

650 0 a| Electron probe microanalysis.=| ^A961;

650 0 a| Electron microscopy.=| ^A4128;

710 1 a| United States.b| National Bureau of Standards.=| ^A44678;

710 2 a| National Measurement Laboratory (U.S.).b| Office of Standard Reference Materials.=| ^A594806;

830 0 a| Standard reference materials.=| ^A420608;

994 a| C0b| ERE;

596 a| 1;

998 a| 994049;

999 a| C 13.2:ST 2/5w| SUDOCc| 1i| 30372012728009d| 4/19/2005l| JDOSm| JOYNERr| Ys| Yt| JDOSBKu| 4/19/2005x| BOOKz| JFEDDOCSo| .STAFF. 0;

Electron probe microanalysis and scanning electron microscopy.

Other author	United States. National Bureau of Standards.
Other author	National Measurement Laboratory (U.S.). Office of Standard Reference Materials.
Format	Book
Publication Info	[Washington, D.C.] : U.S. Dept. of Commerce, National Bureau of Standards, [1981?]
Description	1 folded sheet (6 pages) : illustrations ; 28 cm.
Subjects	Electron probe microanalysis. Electron microscopy.

Series	Standard reference materials Standard reference materials. ^A420608
General note	"Office of Standard Reference Materials."
GPO item number	244
Govt. docs number	C 13.2:St 2/5

Library	Location	Call Number	Status	Item Actions
Joyner	Fed Docs Stacks	C 13.2:ST 2/5	✔ Available	Place Hold

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