Tools

LEADER 01789cam 2200397Ji 4500

001 ocm01531448;

003 OCoLC;

005 20141212182232.0;

008 750709s1975 dcua b f101 0 eng ;

010 a| 75619223;

035 a| (Sirsi) o01531448;

035 a| (OCoLC)1531448;

049 a| ERE#;

050 00 a| QC100b| .U57 no. 427a| QD96.M3;

082 0 a| 389/.08 sa| 545/.33;

086 0 a| C 13.10:427;

111 2 a| Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysisd| (1974 :c| National Bureau of Standards)?| UNAUTHORIZED;

245 10 a| Secondary ion mass spectrometry :b| proceedings of a Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis held at the National Bureau of Standards, Gaithersburg, Md., September 16-18, 1974 /c| edited by K.F.J. Heinrich and D.E. Newbury.;

260 a| Washington :b| U.S. Dept. of Commerce, National Bureau of Standards :b| For sale by the Supt. of Docs., U.S. Govt. Print. Off,c| 1975.;

300 a| x, 227 pages :b| illustrations ;c| 26 cm.;

336 a| text2| rdacontent;

337 a| unmediated2| rdamedia;

338 a| volume2| rdacarrier;

490 1 a| National Bureau of Standards special publication ;v| 427;

500 a| "CODEN: XNBSAV.";

504 a| Includes bibliographical references and index.;

650 0 a| Secondary ion mass spectrometryv| Congresses.=| ^A204718;

650 0 a| Microprobe analysisv| Congresses.=| ^A960;

700 1 a| Heinrich, Kurt F. J.=| ^A343119;

700 1 a| Newbury, Dale E.=| ^A452574;

830 0 a| NBS special publicationv| 427.=| ^A2701;

994 a| C0b| ERE;

596 a| 1;

998 a| 996892;

999 a| C 13.10:427w| SUDOCc| 1i| 30372012763949d| 5/26/2005l| JDOSm| JOYNERr| Ys| Yt| JDOSBKu| 5/26/2005x| BOOKz| JFEDDOCSo| .STAFF. 0;

Secondary ion mass spectrometry : proceedings of a Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis held at the National Bureau of Standards, Gaithersburg, Md., September 16-18, 1974 / edited by K.F.J. Heinrich and D.E. Newbury.

Author/creator	Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis
Other author	Heinrich, Kurt F. J.
Other author	Newbury, Dale E.
Format	Book
Publication Info	Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off, 1975.
Description	x, 227 pages : illustrations ; 26 cm.
Subjects	Secondary ion mass spectrometry--Congresses. Microprobe analysis--Congresses.

Series	National Bureau of Standards special publication ; 427 NBS special publication 427. ^A2701
General note	"CODEN: XNBSAV."
Bibliography note	Includes bibliographical references and index.
LCCN	75619223
Govt. docs number	C 13.10:427

Secondary ion mass spectrometry : proceedings of a Workshop on Secondary Ion Mass Spectrometry and Ion Microprobe Mass Analysis held at the National Bureau of Standards, Gaithersburg, Md., September 16-18, 1974 / edited by K.F.J. Heinrich and D.E. Newbury.

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