Measurement of transistor scattering parameters / George J. Rogers and David E. Sawyer, Ramon L. Jesch.
| Author/creator | Rogers, George J. |
| Other author | Sawyer, David E., author. |
| Other author | Jesch, Ramon L., author. |
| Format | Book |
| Publication Info | [Washington] : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off, 1975. |
| Description | iv, 48 pages : illustrations ; 26 cm. |
| Subjects |
| Series | NBS special publication ; 400-5 Semiconductor measurement technology Semiconductor measurement technology. ^A428054 NBS special publication 400-5. ^A2701 |
| General note | "Jointly sponsored by the National Bureau of Standards and the Air Force Weapons Laboratory." |
| Bibliography note | Includes bibliographical references. |
| LCCN | 74600204 |
| Govt. docs number | C 13.10:400-5 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Fed Docs Stacks | C 13.10:400-5 | ✔ Available | Place Hold |