Tools

LEADER 01775cam 2200421 i 4500

001 ocm01323497;

003 OCoLC;

005 20141212182330.0;

008 750327s1975 dcua b f000 0 eng ;

010 a| 75619089;

035 a| (Sirsi) o01323497;

035 a| (OCoLC)1323497;

049 a| ERE#;

050 00 a| QC100b| .U57 no. 400-11a| TK7871.85;

082 00 a| 389/.08 sa| 621.3815/.2/028;

100 1 a| Mattis, Richard L.=| ^A598123;

245 12 a| A BASIC program for calculating dopant density profiles from capacitance-voltage data /c| Richard L. Mattis and Martin G. Buehler.;

260 a| Washington :b| U.S. Dept. of Commerce, National Bureau of Standards :b| For sale by the Supt. of Docs., U.S. Govt. Print. Off,c| 1975.;

300 a| v, 33 pages :b| illustrations ;c| 26 cm.;

336 a| text2| rdacontent;

337 a| unmediated2| rdamedia;

338 a| volume2| rdacarrier;

490 1 a| Semiconductor measurement technology;

490 1 a| National Bureau of Standards special publication ;v| 400-11;

504 a| Includes bibliographical references.;

650 0 a| Ion implantationx| Data processing.=| ^A44637;

650 0 a| Diodes, Semiconductorx| Data processing.=| ^A43649;

650 0 a| Electric measurementsx| Data processing.=| ^A46318;

650 0 a| BASIC (Computer program language)=| ^A7459;

700 1 a| Buehler, Martin G.,e| author.=| ^A450736;

710 1 a| United States.b| National Bureau of Standards.=| ^A44678;

830 0 a| Semiconductor measurement technology.=| ^A428054;

830 0 a| NBS special publicationv| 400-11.=| ^A2701;

994 a| C0b| ERE;

596 a| 1;

998 a| 997955;

999 a| C 13.10:400-11w| SUDOCc| 1i| 30372013331563d| 6/8/2005l| JDOSm| JOYNERr| Ys| Yt| JDOSBKu| 6/8/2005x| BOOKz| JFEDDOCSo| .STAFF. 0;

A BASIC program for calculating dopant density profiles from capacitance-voltage data / Richard L. Mattis and Martin G. Buehler.

Author/creator	Mattis, Richard L.
Other author	Buehler, Martin G., author.
Other author	United States. National Bureau of Standards.
Format	Book
Publication Info	Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off, 1975.
Description	v, 33 pages : illustrations ; 26 cm.
Subjects	Ion implantation--Data processing. Diodes, Semiconductor--Data processing. Electric measurements--Data processing. BASIC (Computer program language)

Series	Semiconductor measurement technology National Bureau of Standards special publication ; 400-11 Semiconductor measurement technology. ^A428054 NBS special publication 400-11. ^A2701
Bibliography note	Includes bibliographical references.
LCCN	75619089

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