Tools

LEADER 01710cam 2200421 i 4500

001 ocm01992539;

003 OCoLC;

005 20141212182331.0;

008 751231s1976 dcua f000 0 eng ;

010 a| 75619427;

035 a| (Sirsi) o01992539;

035 a| (OCoLC)1992539;

049 a| ERE#;

050 00 a| QC100b| .U57 no. 400-27a| TK7871.85;

082 00 a| 602/.1 sa| 621.3815/2/028;

086 0 a| C 13.10:400-27;

100 1 a| Sawyer, David E.=| ^A452445;

245 10 a| Laser scanning of active semiconductor devices--videotape script /c| David E. Sawyer and David W. Berning.;

260 a| Washington :b| U.S. Dept. of Commerce, National Bureau of Standards :b| For sale by the Supt. of Docs., U.S. Govt. Print. Off,c| 1976.;

300 a| iii, 21 pages :b| illustrations ;c| 26 cm.;

336 a| text2| rdacontent;

337 a| unmediated2| rdamedia;

338 a| volume2| rdacarrier;

490 1 a| Semiconductor measurement technology;

490 1 a| NBS special publication ;v| 400-27;

500 a| "This activity was supported by the Defense Advanced Research Projects Agency and the National Bureau of Standards.";

650 0 a| Semiconductorsx| Testing.=| ^A65728;

650 0 a| Optical scanners.=| ^A132657;

650 0 a| Semiconductor industryx| Laser use in.=| ^A598130;

650 0 a| Lasers.=| ^A12453;

700 1 a| Berning, David W.e| author.=| ^A452446;

830 0 a| Semiconductor measurement technology.=| ^A428054;

830 0 a| NBS special publicationv| 400-27.=| ^A2701;

994 a| C0b| ERE;

596 a| 1;

998 a| 997960;

999 a| C 13.10:400-27w| SUDOCc| 1i| 30372013333841d| 6/8/2005l| JDOSm| JOYNERr| Ys| Yt| JDOSBKu| 6/8/2005x| BOOKz| JFEDDOCSo| .STAFF. 0;

Laser scanning of active semiconductor devices--videotape script / David E. Sawyer and David W. Berning.

Author/creator	Sawyer, David E.
Other author	Berning, David W. author.
Format	Book
Publication Info	Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off, 1976.
Description	iii, 21 pages : illustrations ; 26 cm.
Subjects	Semiconductors--Testing. Optical scanners. Semiconductor industry--Laser use in. Lasers.

Series	Semiconductor measurement technology NBS special publication ; 400-27 Semiconductor measurement technology. ^A428054 NBS special publication 400-27. ^A2701
General note	"This activity was supported by the Defense Advanced Research Projects Agency and the National Bureau of Standards."
LCCN	75619427
Govt. docs number	C 13.10:400-27

Library	Location	Call Number	Status	Item Actions
Joyner	Fed Docs Stacks	C 13.10:400-27	✔ Available	Place Hold

Click here for more information about this title