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001 ocm02389925;

003 OCoLC;

005 20141212182331.0;

008 760730s1977 dcua b 000 0 eng ;

010 a| 76608229;

035 a| (Sirsi) o02389925;

035 a| (OCoLC)2389925;

049 a| ERE#;

050 00 a| QC100b| .U57 no. 400-31a| TK7874;

082 00 a| 602/.1 sa| 621.381/73;

086 0 a| C 13.10:400-31;

100 1 a| Kern, Werner,d| 1925-=| ^A598132;

245 10 a| Techniques for measuring the integrity of passivation overcoats on integrated circuits /c| Werner Kern and Robert B. Comizzoli.;

260 a| Washington :b| U.S. Dept. of Commerce, National Bureau of Standards :b| For sale by the Supt. of Docs., U.S. Govt. Print. Off,c| 1977.;

300 a| xiv, 105 pages :b| illustrations ;c| 26 cm.;

336 a| text2| rdacontent;

337 a| unmediated2| rdamedia;

338 a| volume2| rdacarrier;

490 1 a| Semiconductor measurement technology;

490 1 a| National Bureau of Standards special publication ;v| 400-31;

504 a| Includes bibliographical references.;

650 0 a| Integrated circuitsx| Passivation.=| ^A598133;

650 0 a| Protective coatingsx| Testing.=| ^A73497;

650 0 a| Microelectronicsx| Quality control.=| ^A35901;

700 1 a| Comizzoli, Robert B.,e| author.=| ^A598134;

830 0 a| Semiconductor measurement technology.=| ^A428054;

830 0 a| NBS special publicationv| 400-31.=| ^A2701;

994 a| C0b| ERE;

596 a| 1;

998 a| 997963;

999 a| C 13.10:400-31w| SUDOCc| 1i| 30372013333874d| 6/8/2005l| JDOSm| JOYNERr| Ys| Yt| JDOSBKu| 6/8/2005x| BOOKz| JFEDDOCSo| .STAFF. 0;

Techniques for measuring the integrity of passivation overcoats on integrated circuits / Werner Kern and Robert B. Comizzoli.

Author/creator	Kern, Werner, 1925-
Other author	Comizzoli, Robert B., author.
Format	Book
Publication Info	Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off, 1977.
Description	xiv, 105 pages : illustrations ; 26 cm.
Subjects	Integrated circuits--Passivation. Protective coatings--Testing. Microelectronics--Quality control.

Series	Semiconductor measurement technology National Bureau of Standards special publication ; 400-31 Semiconductor measurement technology. ^A428054 NBS special publication 400-31. ^A2701
Bibliography note	Includes bibliographical references.
LCCN	76608229
Govt. docs number	C 13.10:400-31

Library	Location	Call Number	Status	Item Actions
Joyner	Fed Docs Stacks	C 13.10:400-31	✔ Available	Place Hold

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