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LEADER 01694cam 2200409 i 4500

001 ocm06025928;

003 OCoLC;

005 20141212182333.0;

008 800825s1980 dcua b f000 0 eng ;

010 a| 79600194;

020 c| $8.00;

035 a| (Sirsi) o06025928;

035 a| (OCoLC)6025928;

049 a| ERE#;

050 00 a| QC100b| .U57 no. 400-56a| TK7874;

082 0 a| 602/.18 sa| 621.381/73/02872| 19;

086 0 a| C 13.10:400-56;

100 1 a| Ham, W. E.q| (William Edward),d| 1943-=| ^A598148;

245 10 a| Comprehensive test pattern and approach for characterizing SOS technology /c| W.E. Ham ; supported by the Defense Advanced Research Projects Agency.;

260 a| [Washington, D.C.] :b| U.S. Dept. of Commerce, National Bureau of Standards :b| For sale by the Supt. of Docs., U.S. Govt. Print. Off,c| 1980.;

300 a| xvi, 361 pages :b| illustrations ;c| 27 cm.;

336 a| text2| rdacontent;

337 a| unmediated2| rdamedia;

338 a| volume2| rdacarrier;

490 1 a| NBS special publication ;v| 400-56;

490 1 a| Semiconductor measurement technology;

504 a| Includes bibliographical references.;

650 0 a| Integrated circuitsx| Testing.=| ^A450737;

650 0 a| Integrated circuitsx| Large scale integration.=| ^A110395;

710 1 a| United States.b| Defense Advanced Research Projects Agency.=| ^A87541;

830 0 a| Semiconductor measurement technology.=| ^A428054;

830 0 a| NBS special publicationv| 400-56.=| ^A2701;

994 a| C0b| ERE;

596 a| 1;

998 a| 997986;

999 a| C 13.10:400-56w| SUDOCc| 1i| 30372013334070d| 6/8/2005l| JDOSm| JOYNERr| Ys| Yt| JDOSBKu| 6/8/2005x| BOOKz| JFEDDOCSo| .STAFF. 0;

Comprehensive test pattern and approach for characterizing SOS technology / W.E. Ham ; supported by the Defense Advanced Research Projects Agency.

Author/creator	Ham, W. E., 1943-
Other author	United States. Defense Advanced Research Projects Agency.
Format	Book
Publication Info	[Washington, D.C.] : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off, 1980.
Description	xvi, 361 pages : illustrations ; 27 cm.
Subjects	Integrated circuits--Testing. Integrated circuits--Large scale integration.

Series	NBS special publication ; 400-56 Semiconductor measurement technology Semiconductor measurement technology. ^A428054 NBS special publication 400-56. ^A2701
Bibliography note	Includes bibliographical references.
LCCN	79600194
Govt. docs number	C 13.10:400-56

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Library	Location	Call Number	Status	Item Actions
Joyner	Fed Docs Stacks	C 13.10:400-56	✔ Available	Place Hold

Comprehensive test pattern and approach for characterizing SOS technology / W.E. Ham ; supported by the Defense Advanced Research Projects Agency.

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