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LEADER 01709cam 2200433 i 4500

001 ocm06356739;

003 OCoLC;

005 20141212182333.0;

008 800508s1979 dcua b f000 0 eng ;

010 a| 79600002;

019 a| 4767710;

020 c| $3.00;

035 a| (Sirsi) o06356739;

035 a| (OCoLC)6356739;

049 a| ERE#;

050 00 a| QC100b| .U57 no. 400-57a| TK7871.85;

082 00 a| 602/.18 sa| 621.3815/2;

086 0 a| C 13.10:400-57;

100 1 a| Gilsinn, David,d| 1943-=| ^A491971;

245 10 a| DISTRIB I, an impurity redistribution computer program /c| David Gilsinn and Richard Kraft.;

260 a| [Washington] :b| U.S. Dept. of Commerce, National Bureau of Standards :b| For sale by the Supt. of Docs., U.S. Govt. Print. Off,c| 1979.;

300 a| viii, 122 pages :b| illustrations ;c| 26 cm.;

336 a| text2| rdacontent;

337 a| unmediated2| rdamedia;

338 a| volume2| rdacarrier;

490 1 a| Semiconductor measurement technology;

490 1 a| National Bureau of Standards special publication ;v| 400-57;

504 a| Includes bibliographical references.;

630 00 a| DISTRIB I.=| ^A598149;

650 0 a| Semiconductorsx| Impurity distributionx| Mathematical models.=| ^A268244;

650 0 a| Semiconductorsx| Impurity distributionx| Data processing.=| ^A268244;

700 1 a| Kraft, Richarde| author.=| ^A598150;

830 0 a| Semiconductor measurement technology.=| ^A428054;

830 0 a| NBS special publicationv| 400-57.=| ^A2701;

994 a| C0b| ERE;

596 a| 1;

998 a| 997987;

999 a| C 13.10:400-57w| SUDOCc| 1i| 30372013334088d| 6/8/2005l| JDOSm| JOYNERr| Ys| Yt| JDOSBKu| 6/8/2005x| BOOKz| JFEDDOCSo| .STAFF. 0;

DISTRIB I, an impurity redistribution computer program / David Gilsinn and Richard Kraft.

Author/creator	Gilsinn, David, 1943-
Other author	Kraft, Richard author.
Format	Book
Publication Info	[Washington] : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off, 1979.
Description	viii, 122 pages : illustrations ; 26 cm.
Subjects	DISTRIB I. Semiconductors--Impurity distribution. --Mathematical models. Semiconductors--Impurity distribution. --Data processing.

Series	Semiconductor measurement technology National Bureau of Standards special publication ; 400-57 Semiconductor measurement technology. ^A428054 NBS special publication 400-57. ^A2701
Bibliography note	Includes bibliographical references.
LCCN	79600002
Govt. docs number	C 13.10:400-57

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