Method to determine the quality of sapphire / M.T. Duffy [and others] ; RCA Laboratories ; supported by the Defense Advanced Research Projects Agency.
| Author/creator | Radio Corporation of America |
| Other author | Duffy, M. T. |
| Format | Book |
| Publication Info | Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off, 1980. |
| Description | xiii, 61 pages : graphs ; 26 cm. |
| Subjects |
| Series | NBS special publication ; 400-62 Semiconductor measurement technology Semiconductor measurement technology. ^A428054 NBS special publication 400-62. ^A2701 |
| General note | "Issued August 1980." |
| Bibliography note | Includes bibliographical references. |
| LCCN | 80600103 |
| Govt. docs number | C 13.10:400-62 |