The Relationship between resistivity and dopant density for phosphorus- and boron-doped silicon / W.R. Thurber [and others].
| Other author | Thurber, W. Robert. |
| Format | Book |
| Publication Info | Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., [1981] |
| Description | v, 47 pages ; 26 cm. |
| Subjects |
| Series | NBS special publication ; 400-64 Semiconductor measurement technology Semiconductor measurement technology. ^A428054 NBS special publication 400-64. ^A2701 |
| General note | "Issued May 1981." |
| Bibliography note | Includes bibliographical references. |
| LCCN | 81600052 |
| Govt. docs number | C 13.10:400-64 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | Fed Docs Stacks | C 13.10:400-64 | ✔ Available | Place Hold |