Tools

LEADER 02115cam 2200481 a 4500

001 ocm07664412;

003 OCoLC;

005 20141212182334.0;

008 820217s1981 dcua b f000 0 eng c;

010 a| 80600197;

020 c| $2.00;

035 a| (Sirsi) o07664412;

035 a| (OCoLC)7664412;

049 a| ERE#;

050 00 a| QC100b| .U57 no. 400-65a| TK7874;

082 00 a| 621.381/73/02872| 19;

086 0 a| C 13.10:400-65;

100 1 a| Mitchell, Michael A.=| ^A598157;

245 10 a| Test patterns NBS-28 and NBS-28A :b| random fault interconnect step coverage and other structures /c| Michael A. Mitchell, Loren W. Linholm sponsored by Naval Air Systems Command, Air Force Wright Aeronautical Laboratories.;

260 a| Washington, D.C. :b| U.S. Dept. of Commerce, National Bureau of Standards :b| For sale by the Supt. of Docs., U.S. G.P.O.,c| 1981.;

300 a| iv, 49 pages :b| illustrations ;c| 27 cm.;

336 a| text2| rdacontent;

337 a| unmediated2| rdamedia;

338 a| volume2| rdacarrier;

490 1 a| NBS special publication ;v| 400-65;

490 1 a| Semiconductor measurement technology;

500 a| "Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards.";

500 a| Issued March 1981.";

500 a| S/N 003-003-02297-7.;

504 a| Includes bibliographical references.;

650 0 a| Integrated circuitsx| Testing.=| ^A450737;

650 0 a| Electronic apparatus and appliancesx| Testing.=| ^A82631;

700 1 a| Linholm, Loren W.=| ^A598158;

710 1 a| United States.b| National Bureau of Standards.=| ^A44678;

710 2 a| Air Force Wright Aeronautical Laboratories.=| ^A442668;

710 2 a| Center for Electronics and Electrical Engineering (U.S.)=| ^A443631;

830 0 a| Semiconductor measurement technology.=| ^A428054;

830 0 a| NBS special publicationv| 400-65.=| ^A2701;

994 a| C0b| ERE;

596 a| 1;

998 a| 997995;

999 a| C 13.10:400-65w| SUDOCc| 1i| 30372013334161d| 6/8/2005l| JDOSm| JOYNERr| Ys| Yt| JDOSBKu| 6/8/2005x| BOOKz| JFEDDOCSo| .STAFF. 0;

Test patterns NBS-28 and NBS-28A : random fault interconnect step coverage and other structures / Michael A. Mitchell, Loren W. Linholm sponsored by Naval Air Systems Command, Air Force Wright Aeronautical Laboratories.

Author/creator	Mitchell, Michael A.
Format	Book
Publication Info	Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O., 1981.
Description	iv, 49 pages : illustrations ; 27 cm.
Subjects	Integrated circuits--Testing. Electronic apparatus and appliances--Testing.

Other author/creator	Linholm, Loren W.
Other author/creator	United States. National Bureau of Standards.
Other author/creator	Air Force Wright Aeronautical Laboratories.
Other author/creator	Center for Electronics and Electrical Engineering (U.S.)
Series	NBS special publication ; 400-65 Semiconductor measurement technology Semiconductor measurement technology. ^A428054 NBS special publication 400-65. ^A2701
General note	"Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards."
General note	Issued March 1981."
General note	S/N 003-003-02297-7.
Bibliography note	Includes bibliographical references.
LCCN	80600197
Govt. docs number	C 13.10:400-65

Test patterns NBS-28 and NBS-28A : random fault interconnect step coverage and other structures / Michael A. Mitchell, Loren W. Linholm sponsored by Naval Air Systems Command, Air Force Wright Aeronautical Laboratories.

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