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Cover image for The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems

The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems

by Gizopoulos, Dimitris
2009
Format: Electronic

Location
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Cover image for Advances in electronic testing

Advances in electronic testing

2006
Format: Electronic

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Cover image for International On-Line Testing Symposium

International On-Line Testing Symposium

by Gizopoulos, Dimitris
2007
13th ed.
Format: Electronic

Location
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