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Search Results
Optical metrology for industrialization of optical information processing
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | C 13.58:6060 | ✔ Available |
/LC.GIF&client=easterncarolinaedu)
/LC.GIF&client=easterncarolinaedu)
/LC.GIF&client=easterncarolinaedu)
/LC.GIF&client=easterncarolinaedu)
Expert systems for scanner data environments
| Location | Call # | Status |
|---|---|---|
| Joyner - General Stacks | HF5415.125.M4 1990 | ✔ Available |
