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Cover image for Model-based image matching using location

Model-based image matching using location

Location Call # Status
Joyner - General Stacks TK7882.P3 B35 1985 ✔ Available
Cover image for Local pattern detection

Local pattern detection

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Cover image for Energy minimization methods in computer vision and pattern recognition

Energy minimization methods in computer vision and pattern recognition

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Joyner - General Stacks TA1634 .E53 2005 ✔ Available
Cover image for Progress in pattern recognition, image analysis and applications

Progress in pattern recognition, image analysis and applications

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Cover image for Pattern recognition and artificial intelligence

Pattern recognition and artificial intelligence

Location Call # Status
Joyner - General Stacks Q334 .J64 1976 ✔ Available
Cover image for 2018 3rd International Conference on Pattern Analysis and Intelligent Systems (PAIS)

2018 3rd International Conference on Pattern Analysis and Intelligent Systems (PAIS)

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Cover image for 2018 10th IAPR Workshop on Pattern Recognition in Remote Sensing (PRRS)

2018 10th IAPR Workshop on Pattern Recognition in Remote Sensing (PRRS)

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Cover image for 2018 IEEE CVF Conference on Computer Vision and Pattern Recognition

2018 IEEE CVF Conference on Computer Vision and Pattern Recognition

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Cover image for 2018 IEEE CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)

2018 IEEE CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)

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Cover image for Texture analysis and cartographic feature extraction

Texture analysis and cartographic feature extraction

Location Call # Status
Joyner - Fed Docs Stacks D 103.20/6:0370 ✔ Available