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Cover image for Selected papers on optical low-coherence reflectometry & tomography

Selected papers on optical low-coherence reflectometry & tomography

  • 2000
  • Format: Book
Location Call # Status
Joyner - General Stacks QC476.C6 S45 2001 ✔ Available
Cover image for The MRIS feasibility study

The MRIS feasibility study

Location Call # Status
Joyner - Microforms B300 NAS 1.15:107763 ✔ Available
Cover image for Shielded-twisted-pair cable model for chafe fault detection via time-domain reflectometry

Shielded-twisted-pair cable model for chafe fault detection via time-domain reflectometry

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Cover image for Using six-port and eight-port junctions to measure active and passive circuit parameters

Using six-port and eight-port junctions to measure active and passive circuit parameters

Location Call # Status
Joyner - Fed Docs Stacks C 13.46:673 ✔ Available
Cover image for Application of a non-ideal sliding short to two-port loss measurement

Application of a non-ideal sliding short to two-port loss measurement

Location Call # Status
Joyner - Fed Docs Stacks C 13.46:644 ✔ Available
Cover image for Electronic instrument handbook

Electronic instrument handbook

  • 1995
  • Format: Book
Location Call # Status
Joyner - General Stacks TK7878.4 .E55 1995 ✔ Available