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Handbook of electronic test equipment
| Location | Call # | Status |
|---|---|---|
| Joyner - General Stacks | TK7878.4 .L45 | ✔ Available |
Instruments and measurements for electronics
| Location | Call # | Status |
|---|---|---|
| Joyner - General Stacks | TK7878.4 .H47 | ✔ Available |
Electrical and electronic instrumentation
| Location | Call # | Status |
|---|---|---|
| Joyner - General Stacks | TK7878.4 .C48 1984 | ✔ Available |
Electronic instruments and measurement techniques
| Location | Call # | Status |
|---|---|---|
| Joyner - General Stacks | TK7878.4 .M36 1987 | ✔ Available |
Electronic components and measurements
| Location | Call # | Status |
|---|---|---|
| Joyner - General Stacks | TK7878.4 .W42 | ✔ Available |
Characterization of a high frequency probe assembly for integrated circuit measurement
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.46:663 | ✔ Available |
Possible designs for electric-field-strength probes for millimeter waves
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | C 13.58:88-3084 | ✔ Available |