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Cover image for Handbook of electronic test equipment

Handbook of electronic test equipment

Location Call # Status
Joyner - General Stacks TK7878.4 .L45 ✔ Available
Cover image for Instruments and measurements for electronics

Instruments and measurements for electronics

Location Call # Status
Joyner - General Stacks TK7878.4 .H47 ✔ Available
Cover image for Chemical instrumentation

Chemical instrumentation

Location Call # Status
Joyner - General Stacks QD53 .W39 1994 ✔ Available
Cover image for Electrical and electronic instrumentation

Electrical and electronic instrumentation

Location Call # Status
Joyner - General Stacks TK7878.4 .C48 1984 ✔ Available
Cover image for Electronic instruments and measurement techniques

Electronic instruments and measurement techniques

Location Call # Status
Joyner - General Stacks TK7878.4 .M36 1987 ✔ Available
Cover image for Electronic components and measurements

Electronic components and measurements

Location Call # Status
Joyner - General Stacks TK7878.4 .W42 ✔ Available
Cover image for Characterization of a high frequency probe assembly for integrated circuit measurement

Characterization of a high frequency probe assembly for integrated circuit measurement

Location Call # Status
Joyner - Fed Docs Stacks C 13.46:663 ✔ Available
Cover image for Possible designs for electric-field-strength probes for millimeter waves

Possible designs for electric-field-strength probes for millimeter waves

Location Call # Status
Joyner - Microforms B300 C 13.58:88-3084 ✔ Available