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Cover image for 2018 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)

2018 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)

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Cover image for Equivalence checking of digital circuits

Equivalence checking of digital circuits

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Cover image for Analysis and design of digital systems

Analysis and design of digital systems

Location Call # Status
Joyner - General Stacks TK5105 .U95 ✔ Available
Cover image for Digital techniques

Digital techniques

Location Call # Status
Joyner - Fed Docs Stacks D 301.26/6:D 56/UNIT 4 ✔ Available
Cover image for Interfacing techniques in digital design with emphasis on microprocessors

Interfacing techniques in digital design with emphasis on microprocessors

Location Call # Status
Joyner - General Stacks TK7868.I58 K78 1988 ✔ Available
Cover image for 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)

2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)

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Cover image for 2015 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)

2015 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)

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Cover image for Digital logic testing and simulation

Digital logic testing and simulation

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Cover image for Digital signal processing

Digital signal processing

Location Call # Status
Joyner - General Stacks TK5102.5 .O245 ✔ Available
Cover image for Solid state pulse circuits

Solid state pulse circuits

Location Call # Status
Joyner - General Stacks TK7868.P8 B44 ✔ Available