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Compensation in epitaxial cubic SiC films
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | NAS 1.15:87269 | ✔ Available |
Probability of detection of internal voids in structural ceramics using microfocus radiography
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | NAS 1.15:87164 | ✔ Available |