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Cover image for Reliability and failure of electronic materials and devices

Reliability and failure of electronic materials and devices

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Cover image for Design of dependable computing systems

Design of dependable computing systems

Location Call # Status
Joyner - General Stacks QA76.9.F38 G44 2002 ✔ Available
Cover image for Decade of disaster

Decade of disaster

Location Call # Status
Joyner - General Stacks HV553 .L38 2000 ✔ Available
Cover image for Bayesian safety risk modeling of human-flightdeck automation interaction

Bayesian safety risk modeling of human-flightdeck automation interaction

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Cover image for Success through failure

Success through failure

  • by Petroski, Henry
  • 2018
  • New Princeton Science Library edition
  • Format: Electronic
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Cover image for Handbook of case histories in failure analysis

Handbook of case histories in failure analysis

  • 2019
  • Format: Electronic
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Cover image for Human detection and diagnosis of system failures

Human detection and diagnosis of system failures

Location Call # Status
Joyner - General Stacks TA169.5 .N37 1980 ✔ Available
Cover image for Intelligent diagnosis and prognosis of industrial networked systems

Intelligent diagnosis and prognosis of industrial networked systems

  • 2011
  • Format: Book
Location Call # Status
Joyner - General Stacks TA168 .I48 2011 ✔ Available
Cover image for Reliability of Maintained Systems Subjected to Wear Failure Mechanisms

Reliability of Maintained Systems Subjected to Wear Failure Mechanisms

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Cover image for Reliability technology

Reliability technology

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