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X-ray determination of electron distributions
Joyner Library
- General Stacks
Call Number:
QC721 .W42
X-ray and radium protection, recommendations of International Congress of Radiology
Joyner Library
- Microforms B300
Call Number:
CIS US EXEC MF C13.4-374
X-ray scattering from semiconductors
Joyner Library
- General Stacks
Call Number:
QC611.6.R3 F49 2000
An x-ray diffraction method for determining the amount of austenite in an austenite-ferrite mixture
Joyner Library
- Fed Docs Stacks
Call Number:
C 13.46:709
High-resolution X-ray scattering from thin films to lateral nanostructures
Joyner Library
- General Stacks
Call Number:
QC176.84.O7 P54 2004