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EMI/EMC metrology challenges for industry
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | C 13.58:5068 | ✔ Available |
Proceedings of the 1978 Electromagnetic Interference Workshop
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.10:551 | ✔ Available |