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Cover image for Method for adjusting warp measurements to a different board dimension

Method for adjusting warp measurements to a different board dimension

Location Call # Status
Joyner - Microforms B300 A 13.79:FPL-RN-0273 ✔ Available
Cover image for Computerized technique for recording board defect data

Computerized technique for recording board defect data

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Cover image for Lumber defects caused by insects, fungi and chemical stains

Lumber defects caused by insects, fungi and chemical stains

  • 1990
  • Format: Microform
Location Call # Status
Joyner - NC Documents A75 30:425 ✔ Available
Cover image for West Virginia yellow-poplar lumber defect database

West Virginia yellow-poplar lumber defect database

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