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Cover image for Laser-source integrating sphere reflectometer

Laser-source integrating sphere reflectometer

Joyner Library - Fed Docs Stacks
Call Number: C 13.46:439
Cover image for Calibrating two 6-port reflectometers with only one impedance standard

Calibrating two 6-port reflectometers with only one impedance standard

Joyner Library - Fed Docs Stacks
Call Number: C 13.46:1004
Cover image for Calibrating a six-port reflectometer with four impedance standards

Calibrating a six-port reflectometer with four impedance standards

Joyner Library - Fed Docs Stacks
Call Number: C 13.46:1012
Cover image for Selected papers on optical low-coherence reflectometry & tomography

Selected papers on optical low-coherence reflectometry & tomography

Joyner Library - General Stacks
Call Number: QC476.C6 S45 2001
Cover image for The MRIS feasibility study

The MRIS feasibility study

Joyner Library - Microforms B300
Call Number: NAS 1.15:107763
Cover image for Application of a non-ideal sliding short to two-port loss measurement

Application of a non-ideal sliding short to two-port loss measurement

Joyner Library - Fed Docs Stacks
Call Number: C 13.46:644
Cover image for Using six-port and eight-port junctions to measure active and passive circuit parameters

Using six-port and eight-port junctions to measure active and passive circuit parameters

Joyner Library - Fed Docs Stacks
Call Number: C 13.46:673