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Showing 1 - 10 of 11 results
Search Results
Laser-source integrating sphere reflectometer
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.46:439 | ✔ Available |
Calibrating two 6-port reflectometers with only one impedance standard
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.46:1004 | ✔ Available |
Calibrating a six-port reflectometer with four impedance standards
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.46:1012 | ✔ Available |
Selected papers on optical low-coherence reflectometry & tomography
| Location | Call # | Status |
|---|---|---|
| Joyner - General Stacks | QC476.C6 S45 2001 | ✔ Available |
The MRIS feasibility study
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | NAS 1.15:107763 | ✔ Available |
Application of a non-ideal sliding short to two-port loss measurement
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.46:644 | ✔ Available |
Using six-port and eight-port junctions to measure active and passive circuit parameters
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.46:673 | ✔ Available |