IEEE Computer Society. Technical Council on Test Technology. - ECU Libraries Catalog

Preview Version: You're viewing our new catalog design. Share your feedback or return to the current catalog.

Start Over

You searched for: author IEEE Computer Society. Technical Council on Test Technology.

Showing 1 - 10 of 74 results

Search Results

Cover image for IEEE International High-Level Design Validation and Test Workshop

IEEE International High-Level Design Validation and Test Workshop

by IEEE Computer Society, Technical Council on Test Technology Staff
2000
Format: Electronic

Location
Access Content Online

Cover image for The Seventh IEEE European Test Workshop, ETW '02

The Seventh IEEE European Test Workshop, ETW '02

by IEEE European Test Workshop
2002
Format: Electronic

Location
Access Content Online

Cover image for IOLTS 2006

IOLTS 2006

by IEEE International On-Line Testing Symposium
2006
Format: Electronic

Location
Access Content Online

Cover image for IOLTS 2005

IOLTS 2005

by IEEE International On-Line Testing Symposium
2005
Format: Electronic

Location
Access Content Online

Cover image for Records of the IEEE International Workshop on Memory Technology, Design, and Testing

Records of the IEEE International Workshop on Memory Technology, Design, and Testing

by IEEE International Workshop on Memory Technology, Design, and Testing
1994
Format: Electronic

Location
Access Content Online

Cover image for MSE 2007

MSE 2007

by IEEE International Conference on Microelectronic Systems Education
2007
Format: Electronic

Location
Access Content Online

Cover image for International Test Conference 2004

International Test Conference 2004

by International Test Conference
2004
Format: Electronic

Location
Access Content Online

Cover image for ITC

ITC

by International Test Conference
2001
Format: Electronic

Location
Access Content Online

Cover image for Proceedings International Test Conference 2002

Proceedings International Test Conference 2002

by International Test Conference
2002
Format: Electronic

Location
Access Content Online

Cover image for Proceedings International Test Conference 2003

Proceedings International Test Conference 2003

by International Test Conference
2003
Format: Electronic

Location
Access Content Online