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Cover image for X-ray spectrometry

X-ray spectrometry

  • 1972
  • Format: Electronic
Location
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Cover image for Microbeam analysis

Microbeam analysis

  • 1979
  • Format: Book
Location Call # Status
Joyner - General Stacks QD98.E4 M5 ✔ Available
Cover image for Characterization of particles

Characterization of particles

Location Call # Status
Joyner - Fed Docs Stacks C 13.10:533 ✔ Available
Cover image for Microscopy and microanalysis

Microscopy and microanalysis

  • 1997
  • Format: Electronic
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Cover image for Introduction to analytical electron microscopy

Introduction to analytical electron microscopy

  • 1979
  • Format: Book
Location Call # Status
Joyner - General Stacks TA417.23 .I57 ✔ Available
Cover image for Electronic Device Failure Analysis Technology Roadmap

Electronic Device Failure Analysis Technology Roadmap

  • 2023
  • Format: Electronic
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Cover image for Proceedings of the Society for Experimental Stress Analysis

Proceedings of the Society for Experimental Stress Analysis

Location Call # Status
Joyner - Microforms MICROFILM ✔ Available
Cover image for Experimental stress analysis

Experimental stress analysis

Location Call # Status
Joyner - Microforms MICROFILM ✔ Available
Cover image for Photometric Modeling for Computer Vision and Graphics

Photometric Modeling for Computer Vision and Graphics

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Cover image for IEEE Workshop on Content-Based Access of Image and Video Libraries

IEEE Workshop on Content-Based Access of Image and Video Libraries

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