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Cover image for Capacitance cell measurement of the out-of-plane expansion of thin films

Capacitance cell measurement of the out-of-plane expansion of thin films

by Snyder, Chad R.
2001
Format: Electronic

Location
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Cover image for Survey of FY 2001 nanotechnology related research at the National Institute of Standards and Technology

Survey of FY 2001 nanotechnology related research at the National Institute of Standards and Technology

2001
Format: Microform

Joyner Library - Microforms B300

Call Number: C 13.58:6864