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Cover image for Instruments and measurements for electronics

Instruments and measurements for electronics

Location Call # Status
Joyner - General Stacks TK7878.4 .H47 ✔ Available
Cover image for Electronic instruments and measurement techniques

Electronic instruments and measurement techniques

Location Call # Status
Joyner - General Stacks TK7878.4 .M36 1987 ✔ Available
Cover image for Electronic methods

Electronic methods

Location Call # Status
Joyner - General Stacks QC535 .B63 1975 V.2 PT.A ✔ Available
Cover image for Operational amplifiers

Operational amplifiers

Location Call # Status
Joyner - General Stacks TK7871.58.O6 C53 1992 ✔ Available
Cover image for Electronic methods

Electronic methods

Location Call # Status
Joyner - General Stacks QC535 .B63 ✔ Available
Cover image for Electronic components and measurements

Electronic components and measurements

Location Call # Status
Joyner - General Stacks TK7878.4 .W42 ✔ Available
Cover image for Measurement of transistor scattering parameters

Measurement of transistor scattering parameters

Location Call # Status
Joyner - Fed Docs Stacks C 13.10:400-5 ✔ Available
Cover image for A portable rubidium-vapor frequency standard

A portable rubidium-vapor frequency standard

Location Call # Status
Joyner - Fed Docs Stacks C 13.46:235 ✔ Available
Cover image for Basic concepts in electronic instrumentation

Basic concepts in electronic instrumentation

Location Call # Status
Joyner - General Stacks TK7878.4 .M33 ✔ Available
Cover image for Measurements for technicians

Measurements for technicians

Location Call # Status
Joyner - General Stacks TK275 .M297 ✔ Available