"Electronic circuits+Testing." - ECU Libraries Catalog

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Cover image for Proceedings of the ... International Conference on Microelectronic Test Structures

Proceedings of the ... International Conference on Microelectronic Test Structures

by IEEE International Conference on Microelectronic Test Structures
1989
Format: Electronic

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Cover image for Eleventh IEEE European Test Symposium

Eleventh IEEE European Test Symposium

by IEEE European Test Symposium
2006
Format: Electronic

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Cover image for ETS 2007 : 12th IEEE European Test Symposium

ETS 2007 : 12th IEEE European Test Symposium

by European Test Workshop
2007
Format: Electronic

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Cover image for European Test Symposium

European Test Symposium

by IEEE European Test Symposium
2005
Format: Electronic

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Cover image for Proceedings

Proceedings

by IEEE European Test Symposium
2008
Format: Electronic

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Cover image for A manual wafer probe station for an integrated circuit test system

A manual wafer probe station for an integrated circuit test system

by Carver, G. P.
1981
Format: Book

Location	Call #	Status
Joyner - Fed Docs Stacks	C 13.10:400-68	✔ Available

Cover image for Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits

Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits

by International Symposium on the Physical & Failure Analysis of Integrated Circuits
2001
Format: Electronic

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Cover image for Proceedings of the 9th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2002

Proceedings of the 9th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2002

by International Symposium on the Physical & Failure Analysis of Integrated Circuits
2002
Format: Electronic

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Cover image for Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits

Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits

by International Symposium on the Physical & Failure Analysis of Integrated Circuits
2005
Format: Electronic

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Cover image for Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems

Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems

by IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
2006
Format: Electronic

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