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Cover image for Evaluation of electrical resistivity characteristics of metalized 4H-SiC for application to electric guns

Evaluation of electrical resistivity characteristics of metalized 4H-SiC for application to electric guns

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Cover image for Fast risetime reverse bias pulse failures in SiC PN junction diodes

Fast risetime reverse bias pulse failures in SiC PN junction diodes

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Joyner - Microforms B300 NAS 1.15:107256 ✔ Available
Cover image for Analysis of stress-strain, fracture and ductility behavior of aluminum matrix composites containing discontinuous silicon carbide reinforcement

Analysis of stress-strain, fracture and ductility behavior of aluminum matrix composites containing discontinuous silicon carbide reinforcement

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Joyner - Microforms B300 NAS 1.15:83610 ✔ Available
Cover image for Silicon carbide and related materials 2013

Silicon carbide and related materials 2013

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Cover image for Recent trends and theoretical background in sintering of silicon carbide ceramics

Recent trends and theoretical background in sintering of silicon carbide ceramics

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Joyner - Microforms B300 NAS 1.15:77378 ✔ Available
Cover image for Impact of accelerated stress-tests on SIC MOSFET precursor parameters

Impact of accelerated stress-tests on SIC MOSFET precursor parameters

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Cover image for Breakthrough in power electronics from SiC, May 25, 2004 to May 31, 2005

Breakthrough in power electronics from SiC, May 25, 2004 to May 31, 2005

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Cover image for GaAs high breakdown voltage front and back side processed Schottky detectors for x-ray detection

GaAs high breakdown voltage front and back side processed Schottky detectors for x-ray detection

  • 2007
  • Format: Electronic
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Cover image for Silicon carbide from the People's Republic of China

Silicon carbide from the People's Republic of China

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Joyner - Microforms B300 ITC 1.12:731-TA-651/FINAL ✔ Available
Cover image for Vertical GaN and SiC power devices

Vertical GaN and SiC power devices

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