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An empirical exploration of artificial intelligence for software defect prediction in software engineering
by
Cahill, Elaine
2024
Format:
Theses and dissertations
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The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
by
Gizopoulos, Dimitris
2009
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Electronic
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Unusual capacitance emission transients in CIGS caused by large defect entropy changes
by
Young, David L.
2005
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Electronic
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2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
by
IEEE Electrical Insulation Society Staff
2012
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Electronic
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17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002)
by
IEEE Computer Society Staff
2002
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Electronic
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Photographic guide of selected external defect indicators and associated internal defects in black cherry
by
Rast, Everette D.
1985
Format:
Electronic
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Photographic guide of selected external defect indicators and associated internal defects in northern red oak
by
Rast, Everette D.
1982
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Electronic
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Photographic guide to selected external defect indicators and associated internal defects in black walnut
by
Rast, Everette D.
1988
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Electronic
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Photographic guide of selected external defect indicators and associated internal defects in white oak
by
Rast, Everette D.
1989
Format:
Electronic
Location
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21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
by
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
2006
Format:
Electronic
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