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Cover image for Average power dissipated in a diode swept along its reverse characteristic

Average power dissipated in a diode swept along its reverse characteristic

Location Call # Status
Joyner - Fed Docs Stacks C 13.46:240 ✔ Available
Cover image for Emission stabilization of thermionic diode noise sources

Emission stabilization of thermionic diode noise sources

Location Call # Status
Joyner - Fed Docs Stacks C 13.46:160 ✔ Available
Cover image for Nomographs for use in the fabrication and testing of Ge (Li) detectors

Nomographs for use in the fabrication and testing of Ge (Li) detectors

Location Call # Status
Joyner - Fed Docs Stacks C 13.46:537 ✔ Available
Cover image for Increased efficiency LED

Increased efficiency LED

  • 1996
  • Format: Electronic
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Cover image for LED lighting

LED lighting

  • 2015
  • Format: Electronic
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Cover image for Light-emitting diodes

Light-emitting diodes

Location Call # Status
Joyner - General Stacks TK7871.86 .B2X ✔ Available
Cover image for Avalanche transit-time devices

Avalanche transit-time devices

Location Call # Status
Joyner - General Stacks TK7871.89.Z46 H33 ✔ Available
Cover image for Application of infrared frequency synthesis techniques with metal-insulator-metal diodes to the spin flip Raman laser

Application of infrared frequency synthesis techniques with metal-insulator-metal diodes to the spin flip Raman laser

Location Call # Status
Joyner - Fed Docs Stacks C 13.46:680 ✔ Available
Cover image for Reliability, robustness and failure mechanisms of LED devices

Reliability, robustness and failure mechanisms of LED devices

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Cover image for Improved infrared response technique for detecting defects and impurities in germanium and silicon p-i-n diodes

Improved infrared response technique for detecting defects and impurities in germanium and silicon p-i-n diodes

Location Call # Status
Joyner - Fed Docs Stacks C 13.10:400-13 ✔ Available