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Showing 1 - 10 of 13 results
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Study of InGaAs based MODEFET structures using variable angle spectroscopic ellipsometry
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | NAS 1.15:103792 | ✔ Available |
Ellipsometry and polarized light
| Location | Call # | Status |
|---|---|---|
| Joyner - General Stacks | QC443 .A96 | ✔ Available |
Development of Si[1-x]Ge[x] technology for microwave sensing applications
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | NAS 1.15:106157 | ✔ Available |
Characterization of high Ge content SiGe heterostructures and graded alloy layers using spectroscopic ellipsometry
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | NAS 1.15:112114 | ✔ Available |
A Fortran program for analysis of ellipsometer measurements
| Location | Call # | Status |
|---|---|---|
| Joyner - Fed Docs Stacks | C 13.46:479 | ✔ Available |
Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry
| Location | Call # | Status |
|---|---|---|
| Joyner - Microforms B300 | NAS 1.15:111685 | ✔ Available |